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An Investigation of the Parasitic RC Effects in Nano-scaled FinFETs and Its Impact on SRAM Cells
An Investigation of the Parasitic RC Effects in Nano-scaled FinFETs and Its Impact on SRAM Cells
2016
B. R. Huang
F.-H. Meng
Ya-Chin King
C.-J. Lin
Keywords:
Static random-access memory
Optoelectronics
Nano-
Materials science
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