Investigating the influence of halide distribution on charge carrier dynamics in mixed-ion perovskite films

The mechanism and elemental composition that form the basis for the improved optical and electronic properties of perovskite solar cells are still not well understood. Here, we use synchrotron-based X-ray fluorescence to map the elemental distribution of ions in perovskite thin films with three different film thicknesses. To create a link to the electronic properties, we perform time-resolved photoluminescence spectroscopy and Kelvin probe force microscopy. We find that the elemental composition of the thin films is highly dependent on their thickness which resulted in different photoluminescence behaviors. In particular, we find that the I/Pb ratio is altered for single grains revealing the difference in grain composition. Our approach sheds light onto the fundamental properties occurring at the microscale which help to further engineer perovskite thin films and interfaces.