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Substitutional Carbon Loss in Si:C Stressor Layers Probed by Deep-Level Transient Spectroscopy
Substitutional Carbon Loss in Si:C Stressor Layers Probed by Deep-Level Transient Spectroscopy
2016
Eddy Simoen
Sathish Kumar Dhayalan
Andriy Hikavyy
Roger Loo
Erik Rosseel
Henk Vrielinck
Johan Lauwaert
Keywords:
Stressor
Deep-level transient spectroscopy
Carbon
Nuclear magnetic resonance
Materials science
Atomic physics
carbon loss
Molecular physics
Correction
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