X-ray topographic study of Bridgman-grown CdZnTeSe

Abstract We have characterized the structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot grown by the vertical Bridgman growth technique. The structural quality of Cd0.9Zn0.1Te0.93Se0.07 ingot along the length was investigated via X-ray topography in the reflection mode using a white beam synchrotron radiation source. The X-ray topography data revealed the presence of very few sub grain boundaries and no sub-grain boundary network for the CdZnTeSe samples used in this study.