The Orientation and Grain Texture Effect on Life Time Reliability of Sol–Gel Derived PbZr0.52Ti0.48O3 Films

We fabricated Pb(Zr,Ti)O3 (PZT) films with different orientations and grain textures by the sol–gel method. The fabricated films were tested using the high accelerated lifetime testing system. As a result, films with coarse grain texture exhibited longer lifetimes and a higher acceleration factor than those with fine-grained texture. The film orientation did not affect the mean time to failure of the film. This suggests that breaking phenomena are strongly dependent on the number of grain boundaries.