Method and arrangement for focusing lenses, objects, and condensers in microscopes

In order to provide a method and an arrangement for focusing lenses, objects, and condensers with different microscope types, with which optimum illumination and imaging conditions for the to be examined object planes by an optimum tracking of the condenser during a movement of the lens or an object, in particular for the investigation thicker samples are obtained, a method is proposed in which by a coupled focussing of an objective (2) and a condenser (5) or to the measuring object (1) and the condenser (5) is always on an object plane (3) within the to be examined object (1) is focused so that the object illuminated in details all object planes (3) of the object (1) and the illumination and imaging beam path are coordinated. The coupled focussing means for focusing the lens (2) and the condenser (5) or the object (1) and the condenser (5), either by decoupling the Kondensorbewegung of the stage movement or by decoupling the Kondensorbewegung of the lens movement, taking into account obtained refractive indices, sample thickness and depth of focus within the object (1).