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24pTA-6 Defect structural analysis of semipolar GaN using TEM
24pTA-6 Defect structural analysis of semipolar GaN using TEM
2007
D. Terui
Takashi Yamazaki
Kazuhide Kusakabe
Koji Kuramochi
Kazuhiro Ohkawa
Iwao Hashimoto
Keywords:
Optoelectronics
Materials science
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