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Micro-PL characterization of oxide-confined GaAs VCSEL operating at 850 nm
Micro-PL characterization of oxide-confined GaAs VCSEL operating at 850 nm
2017
Merwan Mokhtari
Philippe Pagnod-Rossiaux
François Laruelle
Jean-Pierre Landesman
Alain Moréac
Christophe Levallois
Keywords:
Vertical-cavity surface-emitting laser
Optoelectronics
Oxide
Materials science
Correction
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