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THERMAL CONDUCTANCE MEASUREMENT OF Al-SiC INTERFACE AT 4-300K USING TIME-DOMAIN THERMOREFLECTANCE TECHNIQUE
THERMAL CONDUCTANCE MEASUREMENT OF Al-SiC INTERFACE AT 4-300K USING TIME-DOMAIN THERMOREFLECTANCE TECHNIQUE
2018
Zhongyin Zhang
Xinwei Wang
Kunpeng Yuan
Fangyuan Sun
Dawei Tang
Keywords:
Analytical chemistry
Materials science
Time-domain thermoreflectance
Thermal conductivity
Optoelectronics
Silicon carbide
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