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Mapping of facet growth n-GaN Schottky contacts using scanning internal photoemission microscopy
Mapping of facet growth n-GaN Schottky contacts using scanning internal photoemission microscopy
2018
Masataka Maeda
Kenji Shiojima
Kaori Kurihara
Keywords:
photoemission microscopy
Optoelectronics
Facet (geometry)
Materials science
Schottky diode
Correction
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