Effect of trap-assisted tunneling on off-current property of a-InGaZnO thin-film transistors

Jihwan Park,Do-Kyung Kim,Jun-Ik Park,Jaehoon Park,Philippe Lang,Muhan Choi,Hyeok Kim,Jin-Hyuk Bae

Effect of trap-assisted tunneling on off-current property of a-InGaZnO thin-film transistors

2020

Jihwan Park
Do-Kyung Kim
Jun-Ik Park
Jaehoon Park
Philippe Lang
Muhan Choi
Hyeok Kim
Jin-Hyuk Bae

We describe how the off-state current (Ioff) property of amorphous InGaZnO (a-IGZO) thin-film transistors is caused by trap-assisted tunneling (TAT) by using a two-dimensional device simulation sof...

Keywords:

Thin-film transistor
Transistor
Optoelectronics
Amorphous solid
device simulation
Quantum tunnelling
Materials science

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