MM-wave dispersion characteristics of a nonlinear transmission line measured by electrooptic sampling
2016
In this work, we present on-wafer near-field scanning of a CMOS nonlinear transmission line with external electrooptic sampling. From Fourier transformation of the scanned voltage on the line, transmission line parameters such as dispersion and varactor capacitance as a function of frequency in the mm-wave range are characterized.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
5
References
1
Citations
NaN
KQI