Beam Quality Factor Analysis of On-Wafer Vertical Cavity Surface Emitting Lasers

Kirk A. Ingold,Joshua D. Tate,Brian Souhan,James J. Raftery

Beam Quality Factor Analysis of On-Wafer Vertical Cavity Surface Emitting Lasers

2018

Kirk A. Ingold
Joshua D. Tate
Brian Souhan
James J. Raftery

We report on a method for analyzing the beam quality factor of on-wafer vertical cavity surface emitting lasers (VCSEL) leading to an M 2 min-max for each measured device due to asymmetry in the beam profile.

Keywords:

Physics
M.2
Optics
Vertical-cavity surface-emitting laser
Laser
M squared
Beam (structure)
Wafer
laser beams
Asymmetry
Optoelectronics
Laser linewidth

Correction
Source
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