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Reliable Resistive Switching Behaviour of Ag/Ta2O5/Al2O3/p++-Si Memory Device
Reliable Resistive Switching Behaviour of Ag/Ta2O5/Al2O3/p++-Si Memory Device
2020
Tian Wei
Nasir Ilyas
Dongyang Li
Chunmei Li
Xiangdong Jiang
Wei Li
Keywords:
Optoelectronics
resistive switching
Materials science
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