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A structured approach for the metrological characterization of biometric systems based on face recognition
A structured approach for the metrological characterization of biometric systems based on face recognition
2010
Betta Giovanni
Domenico Capriglione
Crenna Francesco
Giovan Battista Rossi
Gasparetto Michele
Zappa Emanuele
Consolatina Liguori
Alfredo Paolillo
Keywords:
Metrology
Engineering
Biometrics
Facial recognition system
Artificial intelligence
Computer vision
Engineering drawing
Electronic engineering
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