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STM characterization of point defects in few-layer PtSe 2
STM characterization of point defects in few-layer PtSe 2
2018
Husong Zheng
Fazel Baniasadi
Yichui Choi
Kyungwha Park
Chenggang Tao
Keywords:
Crystallographic defect
Materials science
Molecular physics
Optoelectronics
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