Atomistic-Level Hysteresis-Aware Graphene Structures Electron Transport Model

Hysteretic behavior has been experimentally observed in graphene-based structures and has a major influence on graphene surface potential and gate field modulation ability. Thus, a graphene electronic transport modelling methodology, which incorporates hysteresis effects is crucial in order to properly assess gated-controlled graphene structures response and performance. To this end, we propose an atomistic-level electronic transport model, which is non restricted to rectangular graphene geometries and captures hysteretic effects caused by near-interfacial traps, provided that interface traps trapping/detrapping time constant and density are known. We apply the model on a rectangular graphene shape and validate our results against experimentally measured drain current vs. top gate voltage hysteresis curves. Moreover, to demonstrate model's versatility we consider two non-rectangular Graphene NanoRibbons (GNRs) and investigate their hysteresis behaviour. Our experiments indicate good agreement between simulated and measured results, which qualifies the model appropriate for traps-aware exploration of the conduction behaviour of graphene-based devices and circuits.