Pressure and the quadratic temperature term in the electrical resistance of NbTi

Abstract We have measured the electrical resistance of an Nb 0.53 Ti 0.47 alloy sample as a function of temperature T (4–300 K) and pressure ( T 2 term whose coefficient decreases with pressure. It is linearly dependent on the residual resistance, that also decreases with pressure, in strong agreement with a Koshino–Taylor origin, i.e. inelastic carrier scattering against impurities.