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Investigation of Si 1 - x Ge x films and Si m Ge n superlattices by x-ray diffraction
Investigation of Si 1 - x Ge x films and Si m Ge n superlattices by x-ray diffraction
1992
W. Koschinski
K. Dettmer
F. R. Kessler
Keywords:
X-ray crystallography
Superlattice
Crystallography
Materials science
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