Initial time-dependent current growth phenomenon in n-type organic transistors induced by interfacial dipole effects

We describe an unusual phenomenon of time-dependent current growth in organic transistors, particularly n-type transistors. For an organic transistor based on N,N-ditridecyl-3,4,9,10-perylene tetracarboxylic diimide with a polyimide dielectric layer, the time-dependent increase in the drain current and an approximately hysteresis-free electricity were obtained under dc-bias stress. These phenomena could be attributed to (a) reduction in the trap-state density located at the interface between polyimide and semiconductor, (b) gate field effect enhanced by electric dipoles within polyimide, and (c) a low interface trap lifetime. This study reveals that polymer dielectrics with moderate polar groups are suitable for application in stable organic devices.