Simultaneous measurement of phonons and ionization produced by photons in a 60 g germanium crystal at 25mK: A new method for studying impurity sites in semiconductors.

Abstract We report on the simultaneous measurement of charges and phonons created by particle interactions in a semiconductor at 20 mK. We find that the phonon energy is correlated to the number of charges collected, an effect we model in terms of capture of charges by impurities.