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Bayesian inference using JET’s microwave diagnostic system
Bayesian inference using JET’s microwave diagnostic system
2020
S. Schmuck
J. Svensson
Lorenzo Figini
D. Micheletti
R.B. Morales
Keywords:
Microwave
Physics
Statistical physics
Atomic physics
diagnostic system
Bayesian inference
Gaussian process
Length scale
Bayesian probability
Correction
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