Simulation and optimization of multi-slit based emittance measurement for BNL ERL

A code for determining the beam emittance from a multislit image has been developed. To verify its validity, we simulated a beam distribution in 4D phase space at the multi-slit position and the resulting image at a downstream profile measurement device. We applied the algorithm to this image pattern to recover the beam emittance at the slit position. The dependence of the relative difference of the inferred emittance and the input emittance on the slit width and drift length are studied in detail and presented in this report.