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Electromigration Failure Controlled by Aging-like Gradual Resistance Shift in Co-Capped Cu Interconnects
Electromigration Failure Controlled by Aging-like Gradual Resistance Shift in Co-Capped Cu Interconnects
2021
Hui Zheng
Yongsheng Sun
Weichun Luo
Junlin Huang
Keywords:
Composite material
Materials science
Electromigration
Correction
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