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High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2
High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2
2018
Saiphaneendra Bachu
Danielle Reifsnyder Hickey
Tanushree H. Choudhury
Mikhail Chubarov
Joan M. Redwing
Nasim Alem
Keywords:
Metallurgy
Analytical chemistry
Metalorganic vapour phase epitaxy
Materials science
high resolution
Optoelectronics
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