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Kernelized Stein Discrepancy Tests of Goodness-of-fit for Time-to-Event Data
Kernelized Stein Discrepancy Tests of Goodness-of-fit for Time-to-Event Data
2020
Wenkai Xu
Tamara Fernández
Nicolas Rivera
Arthur Gretton
Keywords:
Pattern recognition
Goodness of fit
Computer science
Artificial intelligence
Machine learning
event data
Correction
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