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Third-Phase Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process
Third-Phase Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process
2019
Hiroto Kobayashi
Ryo Yokogawa
Kosuke Kinoshita
Y. Numasawa
Atsushi Ogura
Shin-Ichi Nishizawa
Takuya Saraya
Kazuo Ito
Toshihiko Takakura
Shinichi Suzuki
Munetoshi Fukui
Kiyoshi Takeuchi
Toshiro Hiramoto
Keywords:
Carrier lifetime
Materials science
Optoelectronics
Insulated-gate bipolar transistor
Third phase
Correction
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