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Depth-resolved tomographic analysis on thick AlN films grown on NPSS using nanobeam X-ray diffraction
Depth-resolved tomographic analysis on thick AlN films grown on NPSS using nanobeam X-ray diffraction
2021
Nozomi Yamamoto
Yusuke Hayashi
Takeaki Hamachi
Yuta Nakanishi
Tetsuya Tohei
Kazushi Sumitani
Yasuhiko Imai
Shigeru Kimura
Kanako Shojiki
Hideto Miyake
Akira Sakai
Keywords:
Optics
Materials science
X-ray crystallography
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