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The C-K edge ELNES analysis of C-C defect model in SiC by first principle calculation.
The C-K edge ELNES analysis of C-C defect model in SiC by first principle calculation.
2020
Takayuki Hirose
Yutaka Terao
Hideaki Teranishi
Aki Takigawa
Keywords:
Condensed matter physics
K-edge
Materials science
First principle
Correction
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