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X-ray emission study of the ZnO/Cu(In,Ga)(S,Se)/sub 2/ interface before and after damp heat treatment
X-ray emission study of the ZnO/Cu(In,Ga)(S,Se)/sub 2/ interface before and after damp heat treatment
2003
Kötschau
Fischer
Grimm
Lauermann
Reichardt
Sieber
Sokoll
Lux-Steiner
Weinhardt
Fuchs
Heske
Jung
Gudat
Niesen
Karg
Keywords:
Optoelectronics
Soft X-ray emission spectroscopy
Scanning electron microscope
damp heat
Spectroscopy
Transistor
Wide-bandgap semiconductor
Zinc
Materials science
X-ray
Correction
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