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Comparison of EUV Brightness With Line-of-Sight Total Electron Content in the Earth's Plasmasphere.
Comparison of EUV Brightness With Line-of-Sight Total Electron Content in the Earth's Plasmasphere.
2007
David Andrew Galvan
Endawoke Yizengaw
Mark B. Moldwin
George Antoine Hajj
T. Mannucci
Bill R. Sandel
Keywords:
Extreme ultraviolet
Brightness
Extreme ultraviolet lithography
Total electron content
Plasmasphere
Physics
Electron density
Optics
Correction
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