Element profiling of thirty genotypes of yam bean in eastern India by using proton induced X-ray emission (PIXE)

Abstract Yam bean (Pachyrizhus erosus L. Urban) is an underutilized tuberous legume crop having a good source of vitamins, minerals, sugar, and dietary fiber for human health. The implication of Proton-induced X-ray emission (PIXE) technique helped in determining the amount of nutrients availability in thirty yam bean genotypes. Certain minor and trace element concentration were identified and quantified in yam bean genotypes as P, S, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, Rb and Sr by using the software package named GUPIX-2000. PIXE measurements were carried out with 3 Me V proton beams with 20 nA beam current on target for element analysis. In the present study, highest quantity of elements such as K (30000 mg Kg−1), Ca (2040 mg Kg−1), Mn (129 mg Kg−1), Cu (18.5 mg Kg−1), Zn (29.4 mg Kg−1), Rb (63.1 mg Kg−1), and Sr (9.74 mg Kg−1) were found in genotype YBBL-20, whereas the highest content of P (9680 mg Kg−1), S (3600 mg Kg−1) and Ni (28.2 mg Kg−1), Fe (395 mg Kg−1), and Ti (35.2 mg Kg−1) was found in EC100549, YBBL-2, EC100567, and EC100551 respectively. This study could be helpful in identifying the nutrition/mineral rich element genotypes and also in providing the nutritional security to the developing countries like India.