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Study on the sensitivity of heavy-ion-induced single event burnout in SiC MOSFET
Study on the sensitivity of heavy-ion-induced single event burnout in SiC MOSFET
2021
Zhang Hong
Hong Xia Guo
Fengqi Zhang
Xiaoyu Pan
Liu Yitian
Zhao-Qiao Gu
Ju Anan
Xiaoping Ouyang
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