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Sub-resolution feature size classification based on tunable X-ray dark-field imaging
Sub-resolution feature size classification based on tunable X-ray dark-field imaging
2021
Benjamin Blykers
Caori Organista Castelblanco
Matias Kagias
Matthieu Boone
Tom Bultreys
Marco Stampanoni
Veerle Cnudde
Jan Aelterman
Keywords:
Dark field microscopy
Feature (computer vision)
Resolution (electron density)
Optics
Physics
X-ray
Correction
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