Thermal Conductivity Measurement of a Sb2Te3 Phase Change Nanowire

In this work we present the measurements of thermal conductivity of nanowire Sb2Te3 phase change. These measurements are made using a thermal scanning probe microscopy (SThM) operating in regime modulated type 3ω. The spatial resolution of the probe is of the order of 100 nm. The measurement of amplitude and phase are used to identify unknown radius of contact between the nanowire and the sensor parameters, the contact resistance at the interface probe and nanowire and the thermal conductivity of the nanowire. An identification method is used which minimizes the difference between the measured values and those from a simulated model of heat transfer in the materials. This model uses a matched model heat transfer in the probe