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Achieving µeV resolution in scanning tunneling spectroscopy at mK temperatures in Al-Al SIS junctions
Achieving µeV resolution in scanning tunneling spectroscopy at mK temperatures in Al-Al SIS junctions
2019
Johannes Schwenk
Sungmin Kim
Julian Berwanger
William G. Cullen
Steven R. Blankenship
Young Kuk
Franz J. Giessibl
Joseph A. Stroscio
Keywords:
Materials science
Resolution (electron density)
Optoelectronics
Scanning tunneling spectroscopy
Correction
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