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Investigation of impurity enrichment and electronic properties of microcrystalline silicon thin films
Investigation of impurity enrichment and electronic properties of microcrystalline silicon thin films
2018
M. Stöger
A Breymesser
P. Schattschneider
V. Schlosser
Keywords:
Thin film
Microcrystalline
Impurity
Materials science
Inorganic chemistry
Silicon
Optoelectronics
microcrystalline silicon
electronic properties
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