Measurement of the life-times distribution of 216Po

Abstract The life time distribution measurements of the alpha emitter 216 Po have been performed with semiconductor detectors. We applied a new method to obtain the distribution of time intervals between the correlated signals of decay of the 216 Po . The deduced half-life of 216 Po was found to be 144.0(6) ms, supporting the earlier published measurements and with an uncertainty much lower than any other previously reported value.