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Trap state characterization of Al 2 O 3 /AlInGaN/GaN metal-insulator-semiconductor heterostructures
Trap state characterization of Al 2 O 3 /AlInGaN/GaN metal-insulator-semiconductor heterostructures
2019
Hirotaka Fujita
Debaleen Biswas
Naoki Torii
Takahiro Yoshida
Toshiharu Kubo
Takashi Egawa
Keywords:
Metal
Insulator (electricity)
Heterojunction
Semiconductor
Optoelectronics
Materials science
nitride semiconductors
semiconductor heterostructures
metal insulator
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