Dose dependence of the production yield of endohedral 133Xe-fullerene by ion implantation

Abstract The production yield of endohedral 133 Xe-fullerene by ion implantation has been studied by taking advantage of the radioactivity of 133 Xe. Fullerene targets, which were produced by vacuum evaporation of C 60 or C 70 on a Ni backing, were bombarded with 30–38 keV 133 Xe ions by using an isotope separator at doses ranging from 1 × 10 12 to 1 × 10 14 cm −2 . The production yield of endohedral 133 Xe-fullerene was determined by an high performance liquid chromatography analysis following the dissolution of the targets in o -dichlorobenzene. It was found that the production yield decreased with increasing dose and incident energy, and the production yield of 133 Xe@C 70 was higher than that of 133 Xe@C 60 for the same dose and incident energy. Those production yields are discussed in connection with amorphization of fullerene molecules in collisions with 133 Xe ions.