Timing Characterization for Static Timing Analysis of Single Flux Quantum Circuits

Single flux quantum (SFQ) logic families require the development of electronic design automation tools to generate large-scale circuits. The available methodologies or tools for performing timing analysis of SFQ circuits do not have a load-dependent timing characterization method for calculating the context-dependent delay of cells, such as the nonlinear delay model for complementary metal–oxide–semiconductor (CMOS) circuits. A new timing characterization method is presented here for SFQ logic cells, which relies on low-dimensional lookup tables (LUTs) to store the clock-to-output delay, setup, and hold times of clocked cells and input-to-output delay of nonclocked cells in an SFQ standard cell library. Although the delay of Josephson junction based logic cells depends on many parameters, this paper shows that it is possible to reduce this dependency to only a small number of well-chosen parameters. All LUTs are obtained from JSIM simulations for a given target process technology. The accuracy of the proposed LUT-based timing characterization method is compared against JSIM simulations, which shows a maximum error of only 2.1% of the tested clocked cells with different loads.