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Structural Defects in SiO2–Si Caused by Ion Bombardment
Structural Defects in SiO2–Si Caused by Ion Bombardment
2008
Antoine Touboul
A. M. J. F. Carvalho
Mathias Marinoni
F. Saigne
Jacques Bonnet
J. Gasiot
Keywords:
Radiochemistry
Ion
Materials science
Photochemistry
ion bombardment
Correction
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