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P‐40: High Reliability Gate Driver Using Reverse Bias Method with Oxide TFTs
P‐40: High Reliability Gate Driver Using Reverse Bias Method with Oxide TFTs
2016
Seungwoo Han
Guangliang Shang
Xing Yao
Haoliang Zheng
Mingfu Han
Yunsik Im
Yinglong Huang
Jungmok Jun
Keywords:
Gate driver
Oxide
Electronic engineering
Materials science
reverse bias
Optoelectronics
Correction
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