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Variable-temperature infrared microscopy of conducting oxide interfaces
Variable-temperature infrared microscopy of conducting oxide interfaces
2020
Stefano Gariglio
Weiwei Luo
Margherita Boselli
Jean-Marie Poumirol
Ivan Ardizzone
Jeremie Teyssier
Dirk van der Marel
Jean-Marc Triscone
Alexey B. Kuzmenko
Keywords:
Oxide
infrared microscopy
Optoelectronics
Materials science
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