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A MEMS Device for Quantitative in situ Mechanical Testing in Electron Microscope
A MEMS Device for Quantitative in situ Mechanical Testing in Electron Microscope
2016
Wang Xiaodong
Shengcheng Mao
Jianfei Zhang
Li Zhipeng
Qingsong Deng
Jin Ning
Xudong Yang
Li Wang
Yuan Ji
Li Xiaochen
Yong Liu
Ze Zhang
Xiaodong Han
Keywords:
Microelectromechanical systems
In situ
Electron microscope
Materials science
Optoelectronics
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