Laser Assisted Deposition of Thin BiSrCaCuO Films

A study of the pulsed laser evaporation process of thin superconducting films using both Nd:YAG and ArF eximer lasers is presented. Nuclear reaction analysis, Rutherford backscattering spectrometry (RBS) and scanning electron microscopy were used to characterize composition, thickness and surface morphology of the deposited films. The influence on the properties of the films, of the various parameters of the method such as photon wavelength, laser power density and geometrical conditions are presented and discussed.