Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques

Measurements of the exchange stiffness D and the exchange constant A of Yttrium Iron Garnet (YIG) films are presented. YIG films with thicknesses from 0.9 to 2.6 µm were investigated with a microwave setup in a wide frequency range from 5 to 40 GHz. The measurements were performed with the external static magnetic field applied in-plane and out-of-plane. The method of Schreiber and Frait (1996 Phys. Rev. B 54 6473), based on the analysis of the perpendicular standing spin wave mode frequency dependence on the applied out-of-plane magnetic field, was used to obtain the exchange stiffness D. This method was modified to avoid the influence of internal magnetic fields during the determination of the exchange stiffness. Furthermore, the method was also adapted for in-plane measurements. The results obtained using all methods are compared and values of D between (5.18 ± 0.01) 10−17 T m2 and (5.40 ± 0.02) 10−17 T m2 were obtained for different thicknesses. From this, the exchange constant was calculated to be A = (3.7 ± 0.4) pJm−1.