A novel method for resonant inelastic soft X-ray scattering via photoelectron spectroscopy detection

A method for measuring resonant inelastic X-ray scattering based on the conversion of X-ray photons into photoelectrons is presented. The setup is compact, relies on commercially available detectors, and offers significant flexibility. This method is demonstrated at the Linac Coherent Light Source with ∼0.5 eV resolution at the cobalt L3-edge, with signal rates comparable with traditional grating spectrometers.