Stresses in Microelectronic Circuits
2014
Ensuring the reliable operation of modern electronic devices requires a good understanding of the magnitude, causes, and effects of stresses. These stresses arise at the box, card, and component scales. Furthermore, they are introduced at the manufacture, assembly, testing, shipping, and operating stages of the device. In this article, the basic considerations for stress analysis at various levels of the device are introduced and discussed.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
17
References
0
Citations
NaN
KQI