INTERPRETINGFITTINGPARAMETERS OFTEMPERATURE DEPENDENCEOFDARK CURRENTSINSOME CCDs

The experimental r-esuilts concerning the temperature dependence ofthedarkcurrents insome charge-coupled devices (CCDs) wereanalyzed Itwas found that theutsed theoretical modelallows: (J) the evalutation ofthelowest lim?7it Ofex-perimental errors (involving thesvstematic ones), (ii) thestutdy of Meyer-Neldel relations, poinlting ouitthehigh correlation ofdiffusion dar-k cuirrents withtheenergy gapEg.unlike thecorresponding weakcorrelation